The 2021 AI Technology Apply in Optical Metrology Forum will be held on March 18, 2021 along with LASER World of PHOTONICS CHINA 2021.
The conference focused on frontier technologies, application solutions and hot topics in the field of optical testing and metrology.
It provides an excellent communication and learning platform for the experts and the industry attendees.
In the industrial design and manufacturing process, optical testing and metrology is an important guarantee for product quality, accuracy and performance. It is widely used in various fields such as auto-related industry, aerospace and intelligent manufacturing.
In response to the "Made in China 2025" initiative, quality is our first priority, Messe Muenchen Shanghai and COS-TCOM will hold the Optical Test and Metrology Frontier Forum in 2021 jointly.
March 18, 2021
W4-M6 (1st floor), Shanghai New International Exhibition Centre
Messe Muenchen Shanghai Co., Ltd.
Topics includ but not limited to:
- Frontiers of Optical Precision Test;
- Advanced Optical Instrument and Technology;
- Application of Advanced Optical Instrument and Technology
Click the “Book” button to the Attendee registration page, apply for a free badge now!
Sponsorship or registration inquiry:
Messe Muenchen (Shanghai) Co., Ltd.
Ms. Ika Fan
Frontier development of optical inspection and imaging technology ；Application of optical inspection technology in intelligent manufacturing
|Time||TopicComputational Imaging: When optics meets deep learning||
|Time||TopicDesign and manufacturing of electromagnetic shielding structure for optical transparent components||
|Time||TopicHigh precision integrated manufacturing technology for large SiC optical aspheric surface||
|Time||TopicLight field and vision imaging technology and its applications in precision manufacturing and measurement||
|Time||TopicInnovative inline high-resolution optical measurement: interferometric flying spot scanner||
|Time||TopicProfile measurement of micro-structures utilizing interferometry||
Prof. Qun Yuan
|Time||TopicFringe pattern processing in optical measurement + deep learning||
Prof. Yingjie Yu
|Time||TopicIn-situ monitoring and analysis technology of micro-area profile and performance for Trans-scale femtosecond Laser machining||